Selected Product
ZEISS LSM 990
Microscopy50 matched patents100% decision confidence
Functional Features
90 nm super-resolution imaging
Airyscan 2 detector integration
Lightfield 4D instant volumetric acquisition
Up to 36 spectral detectors
Spectral information range from 380 to 900 nm
Simultaneous separation of 10+ fluorescent labels
High-speed volumetric imaging
Photomanipulation capability
Design Features
Modular system consisting of an inverted microscope base and attached laser scanning modules
Rectangular scan head module with matte light-gray finish and ZEISS branding
Encased optical path connecting scan head to the microscope body
Multi-port configuration for laser delivery and detector attachment
Inverted objective turret orientation located beneath a large horizontal stage
Computer-controlled motorized stage for sample positioning
Integrated cable management for high-density electronic connections
External laser bank or power supply components connected via fiber optics or cables
Matching Patents
Match Detail
Microscopy method and microscope with enhanced resolution
US8705172B2
This patent covers the fundamental principles of Pixel Reassignment / Airyscan technology. The LSM 990 specifically markets 'Airyscan 2' and '90 nm super-resolution', which directly corresponds to the patent's claims for using sub-PSF detectors to enhance resolution.
3 evidencematchFunctional_Utility95% decision confidence
Patent Element
A detection unit comprising a confocal detector or a 2D detector which has pixels having a pixel size... less than the half-width of the point spread function
Product Feature
Airyscan 2 detector integration
Analysis
The Airyscan detector is a 2D detector array where each element acts as a sub-diffraction-limited pinhole, capturing the PSF in the exact manner described in the patent.
Patent Element
stepwise moving the diffraction-limited point relative to the specimen
Product Feature
Rectangular scan head module
Analysis
The laser scanning process moves the diffraction-limited spot across the sample to generate the image.
Patent Element
A step width of the movement being smaller than the minimal resolvable length
Product Feature
90 nm super-resolution imaging
Analysis
Sub-diffraction scan steps are required to achieve the claimed 90nm resolution.